| A System to Measure the Distribution of the Voltage Measures |
| András Fehér and Szilvia Nagy Széchenyi István University, Radio Frequency Test Laboratory, Egyetem tér 1, GyQr, Hungary, H-9026 |
| Abstract: During conducted measurements the reflection is one of the most varying components of the measurement uncertainty. For studying the distribution of voltage during cable reflections, in this paper we make a simple computational model and statistical analysis of the electric field to determine the distribution of uncertainty for the Voltage (Power) measurement. We also show, that the usually suggested U distribution does not always describe the behavior of the measured values, a beta-distribution is more proper for this purpose. |
| Keywords: Reflection, EM Field, Beta Distribution, Measurement, Measurement Uncertainty A System to Measure the Distribution of the Voltage Measures |
| DOI:https://doi.org/10.6025/jio/2022/12/4/81-88 |
| Full_Text PDF 2.01 MB Download: 91 times |
| References: [1] Multiresolution Analysis of Multiple Reflections in Transmission Lines András Fehér, Ádám Békefi, Szilvia Nagy icest 2012 -xlvii international scientific conference on information, communication and energy systems and technologies, June 28-30, 2012, Veliko Tarnovo, Bulgaria , Proceedings of Papers Volume 1. ISBN: 978-619-167-002-4 p.39-42 |