Home| Contact Us| New Journals| Browse Journals| Journal Prices| For Authors|

Print ISSN: 0976-3511
Online ISSN:

  About JITR
  DLINE Portal Home
Aims & Scope
Editorial Board
Current Issue
Next Issue
Previous Issue
Sample Issue
Upcoming Conferences
Self-archiving policy
Alert Services
Be a Reviewer
Paper Submission
Contact us
  How To Order
  Order Online
Price Information
Request for Complimentary
Print Copy
  For Authors
  Guidelines for Contributors
Online Submission
Call for Papers
Author Rights
Journal of Digital Information Management (JDIM)
International Journal of Computational Linguistics Research (IJCL)
International Journal of Web Application (IJWA)


Journal of Information Technology Review 
Volume: 10, Issue: 1 (  February   2019)
Editorial Message
Measuring Service Quality with Servqual
Sajna, K. P., Mohamed Haneefa, K.
Page: 1-6
Abstract_    Full_Text   210 KB   Download:   34  times
Research Publication of a selected University during 2011-2016: A Study Based on Scopus Database
Sankar, M
Page: 12-16
Abstract_    Full_Text   171 KB   Download:   26  times
What to do when my Parental Organization does not Own a Digital Repository?: A Case of Aggregating Repositories with a Slant to India
Padma, P., Ramasamy, K.
Page: 17-30
Abstract_    Full_Text   6.5 MB   Download:   26  times
Research Contributions in Current Science Journal: A Bibliometric Study
Sanjeevi, K., Sivakumaran, K., Natarajan, V.
Page: 7-11
Abstract_    Full_Text   212 KB   Download:   26  times
Book Review
Probabilistic and Biologically Inspired Feature Representations, by Michael Felsberg, Morgan & Claypool Publishers.2018. ISBN: 9781681730233 (paperback) 9781681730240 (ebook) and 97816817333661 (hardcover).
Conference Notification
. The Tenth International Conference On The Applications Of Digital Information And Web Technologies (ICADIWT 2019)
. Fourteenth International Conference On Digital Information Management (ICDIM 2019)
. Fourth International Conference On Real-time Intellgent Systems (RTIS 2019)
. First International Conference On Science & Technology Metrics