Reliability Assessment of a Star Structured Electronic System
Nikolay Nikolov, Anton Georgiev and Toncho Papanche
Journal of Information Security Research, Vol. 12, No. 4, 2021.
DOI: https://doi.org/10.6025/jisr/2021/12/4/116-122
Link: https://www.dline.info/jisr/fulltext/v12n4/jisrv12n4_3.pdf
Abstract:
In this work we have studied the reliability assessment of a star structured complex electronic system. The normal methods to reliability indices selection and reliability requirements determination are presented. Some specific reliability indices and basic dependences valid for reliability assessment of a star structured electronic system are presented and described.